Core Wafer System - The Leader in Multi-Site On-Wafer Parallel Measurements
Core Wafer Systems provides wafer- and package-level solutions for emerging and future microelectronic technologies for both accelerated and long-term reliability. Our suite of solutions encompasses parellel or serial, single- or multi-site parametric and reliability measurements. We provide a full suite of AC and DC measurements and analysis software. Our measurements and analysis methods are accepted worldwide. We partner with leading edge manufacturing and technology companies on cutting edge reliability measurement for front- and back-end line.

Cutting edge technology and solutions in the nanometer era
The development of nanometer technologies and introduction of new materials has raised testing challenges into the limelight: innovation has higher risk. From technology reports and road maps to the analyst’s reports, testing’s impact on the semiconductor industry is enormous for the 300 mm era and beyond; reliability data is an indispensable part of the process of selecting new materials. Therefore, it is critical to have scalable and cost-effective parametric and reliability testing for modern manufacturing.

ASUR: One hardware, one software, from instruments to systems
• Precision architecture and scalable test control
• Agilent WLR technology DNA inside
• Superior phenomena detection
• Industry’s only dedicated reliability analysis environment
• Improve your timing for business decisions

ASUR is a scalable solution with selectable topology that allows data to be correlated from instruments to system testers. ASUR is used in IDM, foundries, fabless and equipment companies, reducing development cycle time while helping control maturing processes. Useful at all phases of the IC life cycle-development, qualification, production, and quick identification of reliability problems, including mature processes.

Perfect Technology Storm
The Industry Dilemma: Innovation has higher risk. The Development of deep submicron technologies and new materials has raised testing challenges into the limelight. From technology reports and road maps to the analyst's reports, testing's impact on the semiconductor industry industry is enormous for the 300mm era and beyond; reliability data is indispensable in the process of selecting new materials. Therefore, it is critical to have scalable and cost-effective parametric and reliability testing for modern manufacturing.

ASUR: One hardware, one software, from instruments to systems.

ASUR is a scalable solution in which data can be correlated from instruments to systems and to packages testers. ASUR can be used in IDM, Foundries, Fabless and equipment companies, reducing development cycle time while helping control maturing processes. Useful at all phases of the IC life cycle -- development, qualification, production, and quick identification of reliability problems, including the maturing processes -- ASUR is the single-site and multi-site solution for Water Level Reliability and Parametric Test.